Design & Test of Fault-Tolerant E.S. for Aerospace App.

Goal

Let the student understands methodologies of design of systems fault-tolerant, redundancy by hardware and software, based on information and time.

Let the student understands physical mechanisms that cause errors or affect the reliability in environments with ionizing radiation.

Let the student understands methodologies of system testing.

Recommendations

Have basic knowledge of CMOS integrated circuit design, digital systems, information coding, and basic knowledge of reliability.

It is recommended to bring your own notebook to this course. In order to perform the SPICE simulations, LTSpice IV simulator will be use. It is available here. It runs in Windows; and in Mac and Linux, using Wine.

Minimum Content

0) Introduction to CMOS technologies
0.1) CMOS circuits and MOS transistors
0.2) Bulk vs SOI CMOS technologies, FINFETs

1) Fault-Tolerant (FT) Systems: Basic Concepts
1.0) Space environments
1.1) Total-Ionizing Dose (TID)
1.2) Single-Event Effects: Single-Event Upset (SEU), Single-Event Transient (SET)
1.2.1) Electrical model for SEU simulation in SPICE

1.3) Electromagnetic Interference (EMI)
1.4) Test environment and standards for electronics qualification

2) Hardware Redundancy
2.1) Passive
2.2) Active
2.3) Hybrid

3) Software Redundancy
3.1) Error Detecting and Correcting Codes – EDAC
3.1.1) Parity
3.1.2) Berger
3.1.3) Arithmetic
3.1.4) Checksum
3.1.5) CRC
3.1.6) Hamming
3.1.7) Examples

4) Information Redundancy
4.1) Consistency and Capacity Checks
4.2) N-Programming Version
4.3) Recovery Blocks

5) Time Redundancy
5.1) Detection of Transient and Permanent faults
5.2) Detection and Correction of Permanent Faults

6) Aging of Electronics
6.1) Definition, detection and recovery from aging
6.2) On-chip aging sensors

7) Reliability and physics of failure
7.1) Introduction and basic definitions
7.1) Vulnerabilities originating in die
7.2) Vulnerabilities arising from bonding
7.3) Vulnerabilities originated in the encapsulation
7.4) Vulnerabilities and failures in the life-cycle context of integrated circuits

Schedule

Download the schedule in this link!

Teaching Team

Dr. Fabián Vargas (PUCRS) obtained his Ph.D. Degree in Microelectronics from the Institut National Polytechnique de Grenoble (INPG), France, in 1995. At present, he is Full Professor at the Catholic University (PUCRS) in Porto Alegre, Brazil.

His main research domains involve the HW-SW co-design and test of system-on-chip (SoC) for critical applications, system design for radiation and electromagnetic immunities, and embedded sensor design for characterization, reliability and aging binning.

Among several activities, Prof. Vargas has served as Technical Committee Member or Guest-Editor in many IEEE-sponsored conferences and journals. He holds 6 BR and international patents, co-authored a book and published over 200 refereed papers. Prof. Vargas is associate researcher of the BR National Science Foundation since 1996.

He co-founded the IEEE-Computer Society Latin American Test Technology Technical Council (LA-TTTC) in 1997 and the IEEE Latin American Test Symposium – LATS (former Latin American Test Workshop – LATW) in 2000. Prof. Vargas received for several times the Meritorious Service Award of the IEEE Computer Society for providing significant services as chair of the IEEE Latin American Regional TTTC Group and the LATS. Prof. Vargas is a Golden Core Member of the IEEE Computer Society.


Dr. Ing. José Lipovetzky (IB, CAB.CNEA) is an Electronic Engineer (UBA 2005) and a PhD in Engineering (UBA 2010). He is an Adjunct Investigator of CONICET in the Laboratory of Low Temperatures of the Centro Atomico Bariloche and researcher of the National Atomic Energy Commission (CNEA). He is an Adjunct Professor at the Balseiro Institute. He was an Adjunct Professor at the Faculty of Engineering (UBA) where he taught undergraduate and doctoral courses. He is author or co-author of 18 articles in international journals with reference, co-author of four patents, and author more than 35 articles in international congresses. He directed or codirigió eight thesis of degree, one of masters and is director of two doctoral theses. He was Co-Chair of the Argentine School of Microelectronics, Technology and Applications 2011, Publication Chair of the Argentine Congress of Embedded Systems since 2013, reviewer for various international magazines and regional congresses, Local Chair in SERESSA 2014, General Chair LASCAS 2017. Radiation Effects courses in different areas such as BELAS (Brazil 2014, Estonia 2013), PUCRS (Brazil 2012), EAMTA 2013, 2014, and 2016.


Ing. Roberto Manuel Cibils (INVAP SE) is an Electronic Engineer (UTNFRM 1978). He began his career with a fellowship from CONICET in INTEC for the developing of electronic devices using amorphous hydrogenated silicon. From 1984 to 1986 he joined UTNFRSF as an assistant professor of the Systems Engineering career. In 1986 he joined INVAP SE where he developed his professional activity in nuclear and space projects. Among other projects, he participated in the development of the Radiation Monitoring Systems for the ETRR-2 Multipurpose Nuclear Reactor EPC Project, Inshas, Egypt and the OPAL Nuclear Reactor EPC Project, Lucas Heights, Australia. In 2006 he joined the Systems Engineering Staff of ARSAT-1 project for the development of a geostationary communications satellite. He is author of several articles in international journals with reference and international congresses. He is also the author of several national and one international patent on radiation detection devices. He is a reviewer of international publications for the IEEE Transactions on Nuclear Science Journal. Currently he is working on a project for enabling the use of the leading edge technology of commercial electronic components in space missions.

Basic Bibliography

1. “Fault-Tolerant Computer System Design”
Autor: .Dhiraj K. Pradhan.
Editorial: Prentice-Hall,
Edición: 1996

2. “Handbook of Radiation Effects”
Autor: Andrew Holmes-Siedle, L. Adams.
Editorial: Oxford
Edición: 1993

3. “Single Event Effects in Aerospace”
Autor: Petersen E.
Editorial: IEEE Press
Edición: 2011

4. “Reliability Prediction from Burn-In Data Fit to Reliability Models”
Autor: Bernstein J. B.
Editorial: Elsevier
Edición: 2014

5. “Integrated Circuit, Hybrid and Multichip Module Package Design guidelines. A Focus on Reliability”
Autor: Petch M.
Editorial: John Wiley and Sons, Inc
Edición: 1994

6. “Physics-of-Failure Based Handbook of Microelectronic Systems”
Autor: Salemi S., Yang L.,Dai J., Qin J., Bernstein J. B.
Editor: David Nicholls
Edición: 2008

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